december, 2019

10dec1:00 pm5439 Sealed Bid Offer of a Zeiss Wafer Scanning Electron Microscope AuctionSealed Bid Offer of a Zeiss Wafer Scanning Electron Microscope Auction1:00 pm GMT+1 (GMT+01:00) Auctioneer: Equipnet Type:Timed Online Auction

Auction Header

Sealed Bid Offer of a Zeiss Wafer Scanning Electron Microscope Auction

Timed Online Auction

Auctioneer

Equipnet

Where

Santa Clara, CA (United States)

When

2019-12-10 13:00:00 GMT+1 (GMT+01:00)

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Event Details

Electrical characterization for device quality or failure analysis
8-point, 6-point and 4-point probin
Bitcell stability testing
Metal 1-level probing
Contact-level probing
Butterfly curves
Kelvin probing

Auction Inspection

See Auctioneer’s Website for Inspection Information

Terms & Conditions

Timed terms and conditions.

Currency

$

BP

Tax/VAT/GST

X